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canning photo-emission microscopy
Scanning transmission x-ray microscopy
Full field x-ray microscopy
Application of spectroscopy and spectromicroscopy
OLED (organic light emitting devices): Degradation mechanism
PRAM (phase change random access memory): Ge-Sb-Te system
Molecular nitrogens in solids
Effect and use of focused x-rays
Ultrafast (<1 ps) streak camera development for ultrafast dynamics study
Synchrotron radiation experiments
Plasma spectroscopy
Soft x-ray lasers
-Hyunseob Lim, Hyeon Suk Shin, Hyun-Joon Shin, and Hee Cheul Choi, "Lithium Ions Intercalated into Pyrene-Functionalized Carbon Nanotubes and Their Mass Transport: A Chemical Route to Carbon Nanotube Schottky Diode", J. Am. Chem. Soc. 130, 2160-2161 (2008).
-Jouhahn Lee, Jongsun Lim, Hyun-Joon Shin, and Yongsup Park, "Interface electronic structure of the organic light-emitting devices; Photoemission and x-ray absorption studies of Al/KF/Alq3 interface", Appl. Phys. Lett. 91, 261902 (2007).
-Sangwoon Moon, Sukmin Chung, Cheolho Jeon, Chong-Yun Park, Han-Na Hwang, Chan-Cuk Hwang, Hajin Song, and Hyun-Joon Shin, "Patterning of an amine-terminated nanolayer by extreme ultraviolet", Appl. Phys. Lett. 91, 193104 (2007).
-J. Feng, H. J. Shin, J. R. Nasiatka, W. Wan, A. T. Young, G. Huang, A. Comin, J. Byrd and H. A. Padmore, "An x-ray streak camera with high spatio-temporal resolution", Appl. Phys. Lett. 91, 134102 (2007).
-C. Jeon, J. H. Nam, W. Song, C.-Y. Park, J. R. Ahn, M.-C. Jung, H. J. Shin, Y. H. Han, and B. C. Lee, "Chemical phase transitions of a Si oxide film on SiC by MeV electron beam irradiation", Appl. Phys. Lett. 91, 111910 (2007).
-Sangwoon Moon, Cheolho Jeon, Han-Na Hwang, Chan-Cuk Hwang, Hajin Song, Hyun-Joon Shin, Sukmin Chung, and Chong-Yun Park, "Nanolayer Patterning Based on Surface Modification with Extreme Ultraviolet Light", Adv. Mater. 19, 1321-1324 (2007).
-M. C. Jung, H. J. Shin, and J. Chung, "Photoelectron spectrum from a thin organic layer exposed with intense x-rays", J. Appl. Phys. 101, 034907 (2007).
-Kihong Kim, Ju-Chul Park, Jae-Gwan Chung, and Se Ahn Song, Min-Cherl Jung, Young Mi Lee, Hyun-Joon Shin, Bongjin Kuh, Yongho Ha, Jin-Seo Noh, "Observation of molecular nitrogen in N-doped Ge2Sb2Te5", Appl. Phys. Lett. 89, 243520 (2006).
-H. J. Shin, H. J. Song, J. Lee, H. J. Yoon, J. Chung, and J. C. Lee, "Scanning photoelectron microscopic study of top-emission organic light-emitting device degradation under high-bias voltage", J. Appl. Phys. 100, 084504 (2006).
-H. J. Shin, M. C. Jung, J. Chung, K. Kim, J. C. Lee, and S. P. Lee, "Degradation mechanism of organic light-emitting device investigated by scanning photoelectron microscopy coupled with peel-off technique", Appl. Phys. Lett. 89, 063503 (2006).
-M. C. Jung, H. J. Shin, K. Kim, J. S. Noh, and J. Chung, "High-resolution x-ray photoelectron spectroscopy on oxygen-free amorphous Ge2Sb2Te5", Appl. Phys. Lett. 89, 043503 (2006).
-K. W. Kim, Y. Kwon, K. Y. Nam, J. H. Lim, K. G. Kim, K. S. Chon, B. H. Kim, D. E. Kim, B. N. Ahn, H. J. Shin, S. Rah, K. H. Kim, J. S. Chae, D. G. Gweon, D. W. Kang, S. H. Kang, J. Y. Min, K. Choi, S. E. Yoon, E. A. Kim, Y. Namba, and K. H. Yoon, "Compact soft x-ray transmission microscopy with sub-50 nm spatial resolution", Phys. Med. Biol. (Physics in medicine and biology) 51, N99-N107 (2006).
- H. J. Song, H. J. Shin, Y. S. Chung, J. C. Lee, and M. K. Lee, "X-ray absorption and photoelectron spectroscopic study of plasma-nitrided SiO2 films", J. Appl. Phys. 97, 113711 (2005).
-M. G. Kim, H. J. Shin, J. H. Kim, S. H. Park, and Y. K. Sun, "XAS Investigation of Inhomogeneous Metal-Oxygen Bond Covalency in Bulk and Surface for Charge Compensation in Li-Ion Battery Cathode Li[Ni1/3Co1/3Mn1/3]O2 Material", J. Electrochemical Soc. 152, A1320-A1328 (2005).
-J. S. Kang, G. Kim, S. C. Wi, S. S. Lee, S. Choi, Sunglae Cho, S. W. Han, K. H. Kim, H. J. Song, H. J. Shin, A. Sekiyama, S. Kasai, S. Suga, and B. I. Min, "Spatial chemical inhomogeneity and local electronic structure of Mn-doped Ge ferromagnetic semiconductor", Phys. Rev. Lett. 94, 147202 (2005).
-Y. Chung, J. C. Lee, and, H. J. Shin, "Direct observation of interstitial molecular N2 in Si oxynitrides", Appl. Phys. Lett. 86, 022901 (2005, Jan).
-S. Ji, C. Song, J. Koo, K.-B. Lee, Y. J. Park, J. Y. Kim, J. -H. Park, H. J. Shin, J. S. Rhyee, B. H. Oh, and B. K. Cho, "Interference of Magnetic and Anisotropic Tensor Susceptibility Reflections in Resonant X-ray Scattering of GdB4", Phys. Rev. Lett. 91, 57205 (2003).
-I. J. Lee, M. K. Lee, H. J. Shin, S. S. Chang, and H. K. Kim, "Idenfication of Hexagonal Polycrystal in Epitaxially grown InN by Using Synchrotron X-ray Diffraction and Near-edge X-ray Absorption Fine Structure (NEXAFS) Spectroscopy", Appl. Phys. Lett. 82, 2981-2983 (2003).
-H. J. Shin and M. K. Lee, "Nondestructive probe of microstructures covered with a micrometer-thick insulating layer", Appl. Phys. Lett., 79, 1057-1059 (2001).
-M. K. Lee and H. J. Shin, "The Commissioning Results of the First Undulator Beamline at the Pohang Light Source", Nucl. Instrum. and Meth. A467-8, 508-511 (2001).
-M. K. Lee and H. J. Shin, "Soft x-ray spectromicroscope at the Pohang Light Source", Rev. Sci. Instrum., 72, 2605-2609 (2001).
-H. J. Shin, "Design of an undulator radiation beamline at the Pohang Light Source using a viriable-included-angle plane-grating monochromator", J. Korean Phys. Soc. 34, 350 (1999).
-T. N. Lee, S. H. Kim, and H. J. Shin, "Coherence Properties of X-ray Lasers and Synchrotron Undulator Radiation", J. Korean Phys. Soc. 33, 228-232 (1998).a
-H. J. Shin, D. Kim, and T. N. Lee, "Space-resolved extreme ultraviolet (XUV) spectroscopy using a toroidal mirror", Rev. Sci. Instrum. 66, 4222-4226 (1995).
-H. J. Shin, D. Kim, and T. N. Lee, "Soft X-ray Amplification in a Capillary Discharge", Phys. Rev. E50, 1376-1382 (1994).